Optimized Cavity-Enhanced X-Ray Sources for X-Ray Microscopy

摘要

It is now widely recognized that the intensity and brightness of inverse-Compton x-ray light sources can be enhanced through the use of a high finesse optical storage cavity. But the criteria for the practical use and optimization of such cavities are less well understood. We will review those criteria and their application to the development of an optimized high brightness 5-20 keV inverse-Compton x-ray source under development at the University of Hawai'i.