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Formation of p-Type Ultrananocrystalline Diamond/Nonhydrogenated Amorphous Carbon Composite Films Prepared by Coaxial Arc Plasma Deposition with Boron-Incorporated Graphite Targets

机译:通过与硼掺入的石墨靶标的同轴弧等离子体沉积制备的p型超晶金刚石/非氢化非晶碳复合膜的形成

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Boron-doped ultrananocrystalline diamond (UNCD)/nonhydrogenated amorphous carbon (a-C) composite (UNCD/a-C) films were prepared by coaxial arc plasma deposition (CAPD) with boron-blended graphite target. Their growth was achieved at room temperature and a base pressure of less than 10~(-3) Pa (no inflow gas) owing to CAPD, whereas the growth of UNCD films by chemical vapor deposition generally requires high substrate temperatures of more than 700 °C and a hydrogen ambient gas. The formation of p-type conduction was confirmed thermally, namely Seebeck effect, and heterojunction diodes formed with n-type Si exhibited a typical rectifying action. It was demonstrated that CAPD is advantageous to the practical film formation including doping.
机译:通过同轴弧等离子体沉积(CAPD)用硼共混石墨靶制备硼掺杂的超晶金刚石(UNCL)/非氢化的无定形碳(A-C)复合物(UNCED / A-C)膜。由于CAPD,它们在室温下实现的生长和碱性压力小于10〜( - 3)PA(无流入气体),而通过化学气相沉积的UNCED薄膜的生长通常需要高于700°的高基板温度C和氢气环境气体。对P型传导的形成热,即塞贝克效应,并且用N型Si形成的异质结二极管表现出典型的整流作用。结果表明,CAPD对包括掺杂的实际成膜是有利的。

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