Material characterization using passive multispectral polarimetric imagery

摘要

A new method for characterization of unknown targets using passive multispectral polarimetric imagery is pre sented. Previous work makes use of a pBRDF derived equation for the degree of linear polarization and with the aid of multiple incidence angles estimates refractive index and reflection angle. This work uses known incidence and reflection angles along with dispersion equations and polarimetric data at multiple wavelengths to recover the index of refraction. Experimental results are presented showing the new method's ability to characterize a range of materials.