ISO 26262 compliant memory BIST architecture

摘要

The modern automotive industry has entered an era where tendencies are towards the increased automation and connectivity. The proportion of electronics-controlled systems is steadily growing in vehicles. In parallel the safety and reliability requirements to automobiles are becoming more stringent due to the increased number of accidents with fatalities on the roads. The problem is complicated by the fact that automotive has started to use cutting-edge technologies irrespective of their maturity level. This paper describes the use of BIST implementations for self-test of memories in an automotive SoC, to support testing in mission mode. Case study at the end of the paper demonstrates a practical built-in self-test architecture implementation providing efficient solutions for both production and in-field testing.