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Probabilistic Circuit Fault Emulation

机译:概率电路故障仿真

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Due to the ever increasing sensitivity of CMOS circuits to soft errors, reliability is still one of the main research topics in the domain of integrated systems. Recent research has shown, that by tolerating a certain number of errors within the circuit, to an extend, so that they get barely noticed by the user, the circuit could gain substantially in terms of performance, power or area. In order to enable such an approach, a comprehensive analysis of the circuit has to be done. We developed an FPGA-based probability-aware fault emulator supporting this analysis. The demo will show that reliability constraints can be relaxed inside a circuit without a noticeable effect for the end-user, when carefully investigating where the constraints can be relaxed and to what extend. In this demo we will show, how this investigation can be done fast and accurate using our emulation framework.
机译:由于CMOS电路对软错误的敏感性增加,可靠性仍然是集成系统领域的主要研究主题之一。最近的研究表明,通过将电路内的一定数量的误差放在延伸,使得它们几乎没有注意到,电路可以基本上在性能,功率或区域方面获得。为了实现这种方法,必须完成对电路的全面分析。我们开发了一种基于FPGA的概率感知故障仿真器,支持此分析。演示将显示在仔细研究可以放松的地方和延伸的情况下,可以在电路内没有对最终用户的显着效果的电路轻松放宽可靠性约束。在这个演示中,我们将展示,如何使用我们的仿真框架快速准确地完成这项调查。

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