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Temperature Correction for Ceramic Powder X-ray Diffraction at a Higher Temperature

机译:陶瓷粉末X射线衍射在较高温度下的温度校正

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For powder XRD measurement at a higher temperature, there is a great difference (Δ_T) between the temperature (T) detected by a thermocouple in a specimen stage and the actual temperature (T_a) of the ceramic powder surface irradiated by X-ray. The BaTiO_3 ceramic powder was employed to make an temperature correction on heating in light of the change of the ~ 45° characteristic peak in the vicinity of its tetragonal-cubic phase transition point (T_C = 130°C). The thermal relaxation of BaTiO_3 is considered. When the BaTiO_3 ceramic powder was measured at T_C, the phase transition occurred at T = 170°C and Δ_T was determined as 40°C, which is 10°C higher than that of the ceramic bulk. The error of temperature correction is less than ± 3°C at T_C. The approximation of a linear dependency T_a - T was given as a temperature correction line between 25 and 130°C (T_a here).
机译:对于在较高温度下的粉末XRD测量中,在试样阶段中的热电偶检测到的温度(T)之间存在很大的差异(Δ_t),并且由X射线照射的陶瓷粉末表面的实际温度(T_A)。使用BATIO_3陶瓷粉末在其四方 - 立方相转移点附近(T_C = 130℃)附近的〜45°特征峰的变化,在加热上进行温度校正。考虑了BATIO_3的热弛豫。当在T_C测量BATIO_3陶瓷粉末时,在T = 170℃和Δ_t时发生的相转变确定为40°C,其比陶瓷体积高10℃。温度校正误差在T_C处小于±3°C。线性依赖性T_A-T的近似是在25到130°C(这里的T_A)之间的温度校正线。

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