The analysis of the Built-in Electric Field and the Migration of carries In Thermal/Electric-field Poled Fused Silica

摘要

The thermal/electric poling process of fused silica glass is analyzed based on the multi-carriers' model. The carrier continuity equation is applied to calculate the variation of the carrier concentration with time. The border of positive charge and negative charge is analogous to a p-n junction. Calculation of the built-in electric field is based on the Poisson equation. The result shows that the second-order nonlinearity effect is mainly formed by the Na+ depletion in the poled fused silica glass. The non-linear coefficient is calculated, it is agree well with the literature values, which verifies the reliability of the theory. The study provided theoretical foundation for manufacture optical communication components.