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Influence of Substrate on μc-Si: H Thin Films

机译:基材对μC-Si:H薄膜的影响

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By PECVD deposition technology, we mainly investigated the influence of substrate on intrinsic amorphous/microcrystalline silicon thin film prepared at 300°C. We study the crystallization ratio, grain size of the silicon thin film specially. The results reveal that the crystallization ratio and grain size of the silicon thin film changed along with different substrates. The silicon thin film crystallization ratio and grain size changed sharply when using glass and stainless steel substrate. On this work we think ideal μc-Si:H can be obtained by using glass as substrate and in the suitable experimental conditions.
机译:通过PECVD沉积技术,我们主要研究了基质对在300℃下制备的内在非晶/微晶硅薄膜上的影响。我们研究了结晶比,特别是硅薄膜的晶粒尺寸。结果表明,硅薄膜的结晶比和晶粒尺寸随着不同的基材而变化。当使用玻璃和不锈钢基材时,硅薄膜结晶比和晶粒尺寸变化。在这项工作中,我们认为理想的μC-Si:H可以通过使用玻璃作为基质和合适的实验条件来获得。

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