首页> 外文会议>International Conference on Advanced Materials Design and Mechanics >The surface and interface microstructure of epitaxial Pr_(0.7)Sr_(0.3)MnO_3/La_(0.5)Ca_(0.5)MnO_3 bilayer structure
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The surface and interface microstructure of epitaxial Pr_(0.7)Sr_(0.3)MnO_3/La_(0.5)Ca_(0.5)MnO_3 bilayer structure

机译:外延PR_(0.7)SR_(0.3)MNO_3 / LA_(0.5)CA_(0.5)MNO_3双层结构的表面和界面显微组织

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Epitaxial bilayer structure consisting of ferromagnetic (FM) metallic Pr_(0.7)Sr_(0.3)MnO_3 (PSMO) and antiferromagnetic (AFM) insulator La_(0.5)Ca_(0.5)MnO_3 (LCMO) was fabricated on (001)-oriented single crystal SrTiO_3 (STO) substrate by pulsed laser deposition technique. We studied the surface structure and interdiffusion at interface between PSMO and LCMO by using atomic force microscope and grazing incident x-ray reflectivity (GIXRR). The perfect data fitting result of GIXRR indicated that interdiffusion at the interface of Pr_(0.7)Sr_(0.3)MnO_3/La_(0.5)Ca_(0.5)MnO_3 (PSMO/LCMO) could not be negligible; there was a large interdiffusion zone at the PSMO/LCMO interfaces with a thickness of about 7 nm. We found that the thickness of the top layer at air/PSMO interface was about 2.5 nm and the mass density of the top layer was about 76.53% of that of PSMO layer. The surface roughness was about 1.6 nm which was consistent with observation by atomic force microscopy. Normal X-ray diffraction (NXRD) was also employed to investigate the average structure. Except from PSMO and LCMO layer diffraction peaks, we observed another additional peak, which was developed from the large disordered layer resulting from interdiffusion at the interface of PSMO/LCMO. This implied that the variation of crystalline structure of PSMO/LCMO film occurred due to interdiffusion. Surface roughness and interdiffusion played an important role in magnetic properties of FM/AFM bilayer.
机译:由铁磁性(FM)金属PR_(0.7)SR_(0.3)MNO_3(PSMO)和反铁磁(AFM)绝缘体LA_(0.5)CA_(0.5)MNO_3(LCMO)组成的外延双层结构组成(001)单晶SRTIO_3(STO)基板通过脉冲激光沉积技术。通过使用原子力显微镜和放牧入射X射线反射率(GixRR),我们研究了PSMO和LCMO之间的表面结构和相互作用。 GIXRR的完美数据拟合结果表明,PR_(0.7)SR_(0.3)MNO_3 / LA_(0.5)CA_(0.5)MNO_3(PSMO / LCMO)的界面处的相互作用不能忽略不计; PSMO / LCMO接口中有一个大的相互扩散区​​,厚度为约7nm。我们发现,空气/ PSMO界面的顶层的厚度约为2.5nm,顶层的质量密度为PSMO层的质量密度约为76.53%。表面粗糙度为约1.6nm,其与通过原子力显微镜观察一致。还采用正常的X射线衍射(NXRD)来研究平均结构。除了PSMO和LCMO层衍射峰之外,我们观察到另一个额外的峰,这是由PSMO / LCMO界面处的相互作用产生的大无序层开发的额外峰。这暗示由于间隔而发生了PSMO / LCMO膜的晶体结构的变化。表面粗糙度和间隔在FM / AFM双层磁性性质中起重要作用。

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