首页> 外文会议>International Conference on Management, Manufacturing and Materials Engineering >The Q Value Measurement of the Shadow Mask Surface based on Laser Triangulation Measurement Technology
【24h】

The Q Value Measurement of the Shadow Mask Surface based on Laser Triangulation Measurement Technology

机译:基于激光三角测量测量技术的荫罩表面的Q值测量

获取原文

摘要

Using the triangulation method of laser non-contact measurement, the surface shape of CRT's shadow mask and the Q value was high precision measured. Measuring the mesh surface, the laser beam may be all or part through the mesh. The extraction problem of the effective measurement data was studied. Setting the threshold to filter out the invalid data and the data influenced by the mesh, it retained a small amount of valid data. Using data fitting and interpolation methods to process part of the effective data, then extracting the geometry of the mesh surface profile, the good reproducibility results was gotten. The advanced measuring equipment used in production practice was also studied.
机译:使用激光非接触式测量的三角测量方法,CRT的荫罩的表面形状和Q值测量了高精度。测量网格表面,激光束可以全部或通过网格部分。研究了有效测量数据的提取问题。设置阈值以过滤掉无效数据和由网格影响的数据,它保留了少量有效数据。使用数据拟合和插值方法来处理部分有效数据,然后提取网格表面轮廓的几何形状,得到了良好的再现性结果。还研究了生产实践中使用的先进测量设备。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号