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Characterization of anisotropic conduction of horizontally aligned carbon nanotube thin films

机译:水平排列碳纳米管薄膜各向异性传导的表征

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In this paper, the anisotropic conductivities of Horizontally Aligned Carbon Nanotube (HACNT) thin film are characterized using Vector Network Analyzer (VNA) and four-probe technique. For microwave (X-band), the transmission experiments are performed in a waveguide setup and the conductivities of HACNT thin film are extracted using the uniform field approximation. For two CNTs orientation directions, the results are about 1000 S/m and 3000 S/m, respectively. The DC conductivities are measured using the four-probe method. The average conductivities are 1360 S/m and 1903 S/m, respectively. These results confirm the anisotropic conduction of HACNT thin film.
机译:在本文中,使用载体网络分析仪(VNA)和四探针技术表征了水平对齐的碳纳米管(HACNT)薄膜的各向异性导电性。对于微波(X波段),在波导设置中进行传输实验,并且使用均匀的场近似提取HACNT薄膜的电导率。对于两个CNTS取向方向,结果分别为约1000 s / m和3000 s / m。使用四探针方法测量DC电导率。平均电导率分别为1360 s / m和1903 s / m。这些结果证实了HACNT薄膜的各向异性传导。

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