This paper deals with the near-field to far-field transformation for electromagnetic compatibility (EMC) testing. Since the conventional EMC testing has an inefficient measurement process, Stratton-Chu formula is used to predict the far-field emission by a simple and direct process. The near-filed of a microstrip patch antenna is extracted at regular interval from the focused plane, and the far-field is generated from the near-field by Stratton-Chu formula. Through the three-dimensional electromagnetic (EM) field simulation, calculated far-field results of the patch antenna from Stratton-Chu formula computation are proven to be available. In comparison with full-wave analysis, outcomes of computed far-field have error less than 3.1%.
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