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Spectroscopic study of amorphous As2Se3:Snx and (As2S1.5Se1.5)1-x:Snx thin films

机译:无定形ASSE3:SNX和(AS2S1.5SE1.5)1-X:SNX薄膜的光谱研究

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The transmission spectra of bulk and thin films of (As_2S_(1.5)Se_(1.5))_(1-x):Sn_x in the visible and near infrared (IR) regions were investigated. Doping of As_2S_(1.5)Se_(1.5) chalcogenide glass with tin impurities essentially reduce the absorption bands of SH (Se-H) and H_2O located at ν = 5190 cm~(-1) and ν = 3617 cm~(-1), respectively. The amorphous As_2Se_3:Sn_x and (As_2S_(1.5)Se_(1.5))_(1-x):Sn_x thin films exhibit photoinduced effects under the light irradiation with photon energy above the optical band gap (hν≥E_g), that make its perspective materials for registration of optical and holographic information. The modification of optical parameters (optical band gap E_g, absorption coefficient α, refractive index n) under light irradiation and heat treatment of the amorphous thin films with different amount of Sn was studied. The shift of the absorption edge after light exposure to lower energy region was observed, i.e. the effect of photodarkening take place. The dispersions curves n=f(λ) show a modification of the refractive index n under light exposure. For the glass composition (As_2S_(1.5)Se_(1.5))_(0.96):Sn_(0.04) the change of the optical band gap Eg~(opt) under light exposure was determined from 1.92±0.02 eV to 1.86±0.02 eV. The similar calculations of the optical constants were done for the amorphous films of glass compositions x=0.03 and x=0.05. The relaxation of photodarkening in amorphous As_2Se_3:Sn_x and (As_2S_(1.5)Se_(1.5))_(1-x):Sn_x thin films, which is described by the stretch exponential function T(t)/T(0) = A_0+Aexp[-(t-t_0)/τ]~((1-α))also wasinvestigated. The experimental results are interpreted in framework of the model of molecular structure of chalcogenide glasses doped with tin impurities.
机译:(AS_2S_(1.5)SE_(1.5))_(1-X):可见和近红外(IR)区域中的散装和薄膜的透射光谱(AS_2S_(1.5)SE_(1.5)):SN_X。掺杂AS_2S_(1.5)SE_(1.5)用锡杂质的硫属化物玻璃基本上减少了SH(SE-H)和位于χ= 5190cm〜(-1)的H_2O的吸收带和ν= 3617cm〜(-1) , 分别。无定形AS_2SE_3:SN_X和(AS_2S_(1.5)SE_(1.5))_(1-x):SN_X薄膜在光线能量下方的光线电能下表现出光线辐射的效果(Hν≥e_g),使其光学和全息信息注册的透视材料。研究了光学参数(光带间隙E_G,吸收系数α,折射率N)的改变,并进行了不同量的Sn的无定形薄膜的光照射和热处理。观察到光暴露于较低能量区域后的吸收边缘的偏移,即拍摄的效果发生。分散体曲线n = f(λ)显示在曝光下折射率n的修饰。对于玻璃组合物(AS_2S_(1.5)SE_(1.5))_(0.04):SN_(0.04)光曝光下的光带间隙的变化(0.04),测定从1.92±0.02 EV至1.86±0.02eV 。为玻璃组合物的非晶膜X = 0.03和X = 0.05进行了相似的光学常数计算。在非晶AS_2SE_3:SN_X和(AS_2S_(1.5)SE_(1.5))_(1-x):SN_X薄膜中的弛豫,由拉伸指数函数T(t)/ t(0)= a_0描述+ aexp [ - (t-t_0)/τ]〜((1-α))也是如此。实验结果被解释在掺杂锡杂质的硫属化物玻璃的分子结构模型的框架中。

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