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Analysis and Optimization of Sensitivity of a MEMS Peizoresistive Pressure Sensor

机译:MEMS Peizorationistive压力传感器敏感性的分析与优化

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This paper presents a MEMS Piezoresistive pressure sensor which utilizes a circular shaped polysilicon diaphragm with a nanowire to enhance the sensitivity of the pressure sensor. The polysilicon nanowire is fabricated in such a way that it forms a bridge between the circular polysilicon diaphragm and the substrate. The high Piezoresistive effect of Silicon nanowires is used to enhance the sensitivity. A circular polysilicon nanowire piezoresistor was fabricated by means of reactive ion etching. This paper describes the performance analysis, structural design and fabrication of piezoresistive pressure sensor using simulation technique. The polysilicon nanowire pressure sensor has a circular diaphragm of 500nm radius and has a thickness about 10nm. Finite element method (FEM) is adopted to optimize the sensor output and to improve the sensitivity of the circular shaped diaphragm of a polysilicon nanowire Piezoresistive pressure sensor. The best position to place the Polysilicon nanowires to receive maximum stress was also considered during the design process..The fabricated polysilicon nanowire has high sensitivity of about 133 mV/VKPa.
机译:本文介绍了MEMS压阻式压力传感器,其利用圆形多晶硅膜片与纳米线一起增强压力传感器的灵敏度。多晶硅纳米线以使其在圆形多晶硅膜片和基板之间形成桥梁。硅纳米线的高压阻效应用于增强灵敏度。通过反应离子蚀刻制造圆形多晶硅纳米线压阻器。本文介绍了使用仿真技术进行压阻式压力传感器的性能分析,结构设计和制造。多晶硅纳米线压力传感器具有500nm半径的圆形隔膜并且具有约10nm的厚度。采用有限元法(FEM)来优化传感器输出,提高多晶硅纳米线压阻压力传感器的圆形隔膜的灵敏度。在设计过程中还考虑了将多晶硅纳米线放置到接收最大应力的最佳位置。制造的多晶硅纳米线具有高约133mV / VkPa的敏感性。

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