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An Circuit Fault Diagnosis Method with K-Means Kernel Density Estimation

机译:K-is内核密度估计的电路故障诊断方法

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A K-Means kernel density estimation was proposed and it was used in the pretreatment process of circuit fault diagnosis. The unequal division and losing division problem caused by the traditional method are solved by this method. It also avoid the singular problem which is usually caused by the high dimension of characteristic data. A kernel function is designed and it was integrated with fuzzy support vector machine method to solve the classification problem of multi-faults. At last, a solution of optimal bandwidth is given to improve the proposed method.
机译:提出了K-Means核密度估计,并用于电路故障诊断的预处理过程。通过这种方法解决了传统方法造成的不等分裂和丢失的划分问题。它还避免了通常由特征数据的高尺寸引起的奇异问题。设计内核功能,并与模糊支持向量机方法集成,以解决多故障的分类问题。最后,给出了最佳带宽的解决方案来提高所提出的方法。

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