The sample allocation plan of testability verification for mechatronics equipment based on integrated multi-factor

摘要

To settle the problem such as the low confidence_ level of the testability verification test conclusion resulting from the irrational sample allocation plan for mechatronics equipment, this paper proposes the sample allocation plan based on integrated multi-factor by analyzing some key factors that affect the confidence level of conclusion. The sample size of every UUT was counted by relative ratio of integrated multi-factor, which can optimize failure sampling structure and advance the representation of failure sampling set. Moreover, the single-step failure propagation algorithm was improved, and the algorithm can calculate failure propagation intensity more effectively. Finally, aimed at stabilization and tracking platform, this paper use the sample allocation plan based on integrated multi-factor to allocate samples. By analyzing the result, it proves that the plan can optimize failure sampling structure and improve the confidence level of the testability verification test conclusion.