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Phase Contrast Imaging with Coded Apertures Using Laboratory‐Based X‐ray Sources

机译:使用基于实验室的X射线源的编码孔的相位对比度成像

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X‐ray phase contrast imaging is a powerful technique that allows detection of changes in the phase of x‐ray wavefronts as they pass through a sample. As a result, details not visible in conventional x‐ray absorption imaging can be detected. Until recently the majority of applications of phase contrast imaging were at synchrotron facilities due to the availability of their high flux and coherence; however, a number of techniques have appeared recently that allow phase contrast imaging to be performed using laboratory sources. Here we describe a phase contrast imaging technique, developed at University College London, that uses two coded apertures. The x‐ray beam is shaped by the pre‐sample aperture, and small deviations in the x‐ray propagation direction are detected with the help of the detector aperture. In contrast with other methods, it has a much more relaxed requirement for the source size (it works with source sizes up to 100 μm). A working prototype coded‐aperture system has been built. An x‐ray detector with directly deposited columnar CsI has been used to minimize signal spill‐over into neighboring pixels. Phase contrast images obtained with the system have demonstrated its effectiveness for imaging low‐absorption materials.
机译:X射线相位对比度成像是一种强大的技术,允许在通过样品时检测X射线波前的阶段的变化。结果,可以检测在传统X射线吸收成像中不可见的细节。直到最近,由于其高通量和连贯性的可用性,相位对比度成像的大多数阶段对比度成像的应用;然而,最近出现了许多技术,其允许使用实验室来源进行相位对比度成像。在这里,我们描述了在伦敦大学学院开发的相位对比度成像技术,它使用了两个编码孔。 X射线束由预采样孔的成形,并且在检测器孔的帮助下检测X射线传播方向上的小偏差。与其他方法相比,它对源大小有一个更加轻松的要求(它适用于源大小,最多100μm)。建立了一个工作原型编码孔径系统。具有直接沉积柱状CSI的X射线检测器已被用于将信号溢出到相邻像素中的信号溢出。通过该系统获得的相位对比图像已经证明了其对成像低吸收材料的有效性。

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