Measurement of characteristics of a XUV capillary laser

摘要

This work concerns in measurement of characteristics of a XUV argon capillary laser, which was developed at the Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering. This laser generates at 46.9 nm in Ne - like Ar. Young's double pinhole experiment was realized to estimate spatial coherence of this laser system and to detect the beam profile. We used double pinholes drilled by Ti:saphire laser with four different pinhole separations. pinhole separations were 50 μm, 60 μ m, 100 μm and 150 μm. Apertures had oval shape with diameter 20 - 25 μ m. Interference structure was detected by XUV CCD camera with resolution 512x512 pixels. This work contains also short overview about sources of XUV radiation.