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Solar light trapping in slanted conical-pore photonic crystals

机译:倾斜圆锥形光子晶体的太阳光捕获

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We show that with only one micron, equivalent bulk thickness, of crystalline silicon, sculpted into the form of a slanted conical-pore photonic crystal and placed on a silver back-reflector, it is possible to attain a maximum achievable photocurrent density (MAPD) of 35.5mA/cm~2 from impinging sunlight [1]. This corresponds to absorbing roughly 85% of sunlight in the wavelength range 300-1 l00mn and exceeds the Lambertian limit suggested by previous "statistical ray trapping" arguments. When the silicon volume is reduced to an equivalent thickness of only 380mn, the MAPD remains as high as 32mA/cm~2. This suggests the possibility of very high efficiency, ultra-thin-film silicon solar cells. Our one-micron structure consists of a photonic crystal square lattice constant of 850mn and slightly overlapping inverted cones with upper (base) radius of 500mn and 1600mn cone depth. When the solar cell is packaged with silica (each pore filled with SiO_2 and modulation on the top is added), the MAPD in the wavelength range of 400-1 l00mn becomes 32.6mA/cm~2 still higher than the Lambertian 4n~2 benchmark of 31.2mA/cm~2. Thinner structures are considered by keeping the lattice constant and cone radius fixed but by decreasing the cone depth. The MAPD dependence on the overall depth of nanopores indicates that using roughly half the amount of silicon leads to only about 5% drop in the MAPD. In the near infrared regime light is absorbed within slow group velocity modes, that propagate nearly parallel to the interface and exhibit localized high intensity vortex-like flow in the Poynting vector-field.
机译:我们表明,只有一个微米,相当于晶体厚度的晶体硅,雕刻成倾斜锥形孔光子晶体的形式并放置在银背反射器上,可以获得最大可实现的光电流密度(MAPD)从撞击阳光照射的35.5mA / cm〜2。这对应于波长范围300-1 L00Mn的波长范围的大约85%的太阳光,并超过以前的“统计射线捕获”参数所建议的兰伯语极限。当硅容积减小到仅380mn的等效厚度时,MAPD保持高达32mA / cm〜2。这表明了非常高效率,超薄薄膜硅太阳能电池的可能性。我们的单微米结构包括光子晶体方晶格常数为850mn,略微重叠倒置锥体,上(底座)半径为500mn和1600mn锥形深度。当太阳能电池用二氧化硅包装时(添加有SiO_2的每个孔并加入顶部的调制),波长范围为400-1 L00Mn的波长范围为32.6mA / cm〜2仍高于Lambertian 4N〜2基准测试31.2ma / cm〜2。通过保持晶格常数和锥半径固定而是通过降低锥深度来考虑更薄的结构。对纳米孔的整体深度的MAPD依赖性表明,使用大约一半的硅的量导致MAPD中的约5%滴。在近红外线状态下,在慢组速度模式内被吸收,该模式几乎平行于界面传播,并在Poynting Vector-younts中表现出局部的高强度涡流。

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