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Optical and electrical properties of tin oxide-based thin films prepared by streaming process for electrodeless electrochemical deposition

机译:基于氧化锡的氧化锡的光学和电性能通过辐射过程制备的无电极电化学沉积

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Transparent conducting thin-films of SnO_2: F were grown on preheated glass, Al_2O_3 coated glass, and quartz substrates by Streaming Process for Electrodeless Electrochemical Deposition (SPEED). Stannic chloride (SnCl_4) and ammonium fluoride (NH_4F) dissolved in a mixture of deionized water and organic solvents were used as precursors. The preheated substrate temperature was varied between 440 and 500 °C. High quality SnO_2:F films were grown at all the substrate temperatures studied The resulting typical film thickness was 250 nm. X-ray diffraction shows that the grown films are polycrystalline SnO_2 with a tetragonal crystal structure. The average optical transmission of the films was around 93% throughout the wavelength range 400 to 1000 nm. The lowest electrical resistivity achieved was 6 × 10~(-4) Ω-cm. The Hall measurements showed that the film is an n-type semiconductor, with carrier mobility of 8.3 cm~2/V-s, and carrier concentration of 1 × 10~(21) cm~(-3). The direct bandgap was determined to be 4.0 eV from the transmittance spectrum.
机译:通过流式电化学沉积(速度)通过流式传输过程在预热的玻璃,Al_2O_3涂覆的玻璃和石英基板上生长SnO_2:F的透明导电薄膜。溶解在去离子水和有机溶剂的混合物中的二甲氯化物(SnCl_4)和氟化铵(NH_4F)作为前体。预热的衬底温度在440至500℃之间变化。高质量的SnO_2:F薄膜在所有基板温度下生长,所得到的典型膜厚度为250nm。 X射线衍射表明,生长的薄膜是具有四边形晶体结构的多晶SnO_2。薄膜的平均光学传递在整个波长范围内的93%约为400至1000nm。实现的最低电阻率为6×10〜(-4)Ω-cm。霍尔测量结果表明,薄膜是N型半导体,载流子迁移率为8.3cm〜2 / V-s,载体浓度为1×10〜(21)cm〜(-3)。直接带隙从透射谱确定为4.0eV。

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