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Fabrication and Characterization of High Frequency Phased Arrays for NDE Imaging

机译:NDE成像的高频相位阵列的制造与表征

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摘要

PMN-PT single crystal 1-3 composite high frequency phased arrays with center frequency of 35 MHz were fabricated and characterized for silicon carbide (SiC) NDE imaging applications. The 35 MHz 64-element array was successfully prototyped using PMN-PT single crystal and PC-MUT technology. The broad bandwidth > 90% and high sensitivity ( echo amplitude > 500 mV from the impulse response with 0 gain) was observed with reasonably high uniformity. These high frequency phased arrays are promising for ceramic NDE imaging.
机译:PMN-PT单晶1-3具有35MHz的中心频率的复合高频相位阵列,并针对碳化硅(SIC)NDE成像应用。使用PMN-PT单晶和PC-MUT技术成功伪装了35 MHz 64元件阵列。具有相当高的均匀性,观察到宽带宽> 90%和高灵敏度(从脉冲响应的回波幅度> 500mV)。这些高频相控阵是陶瓷NDE成像的承诺。

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