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Fabrication and Characterization of High Frequency Phased Arrays for NDE Imaging

机译:NDE成像的高频相控阵的制作与表征

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PMN-PT single crystal 1-3 composite high frequency phased arrays with center frequency of 35 MHz were fabricated and characterized for silicon carbide (SiC) NDE imaging applications. The 35 MHz 64-element array was successfully prototyped using PMN-PT single crystal and PC-MUT technology. The broad bandwidth > 90% and high sensitivity (echo amplitude > 500 mV from the impulse response with 0 gain) was observed with reasonably high uniformity. These high frequency phased arrays are promising for ceramic NDE imaging.
机译:制备了中心频率为35 MHz的PMN-PT单晶1-3复合高频相控阵,并对其进行了表征,以用于碳化硅(SiC)NDE成像应用。 35 MHz 64元素阵列已成功使用PMN-PT单晶和PC-MUT技术进行原型制作。观察到宽带宽> 90%和高灵敏度(相对于零增益的脉冲响应,回波幅度> 500 mV),并且具有相当高的均匀度。这些高频相控阵有望用于陶瓷NDE成像。

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