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Microsystem Technology for Eddy Current Testing

机译:用于涡流测试的微系统技术

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Magnetic flux leakage detection and eddy current testing is studied more and more by means of sensor chips based on thin film technology. Magnetoresistive sensor chips, for example, are used to measure AC or DC magnetic fields emitted by the device under test. In case of surface cracks detection, the magnetic field sensing elements (e.g. GMR-stripes) must be placed very close to the surface under test. Here we show techniques to achieve distances in the order of 100μm between the sensing elements and the cracks. In addition we demonstrate a high density of GMR elements in a linear array. Both aspects together allow to detect small surface cracks with a high spatial resolution. Alternatively two dimensional microcoil arrays can be implemented in the design. These microcoils can have diameters smaller than 300μm and can have a magnetic core.
机译:通过基于薄膜技术的传感器芯片越来越多地研究了磁通漏电检测和涡流测试。例如,磁阻传感器芯片用于测量被测器件发出的AC或DC磁场。在表面裂缝检测的情况下,磁场感测元件(例如GMR条纹)必须非常靠近被测表面放置。在这里,我们示出了在传感元件和裂缝之间的100μm的距离上实现距离的技术。此外,我们在线性阵列中展示了高密度的GMR元素。两个方面都允许检测具有高空间分辨率的小表面裂缝。或者,可以在设计中实现二维微罩阵列。这些微膜可以具有小于300μm的直径并且可以具有磁芯。

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