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New Directions in X-ray Tomography

机译:X射线断层扫描中的新方向

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Complex materials such as composites or aggregates often contain weakly absorbing constituents and have to be analysed at different length-scales to be fully understood. This makes them challenging objects for classical X-ray tomography. Examples include porous media such as wood, concrete or foams, coatings of medical implants or fibre reinforced polymers., The latter are becoming a major material in light-weight structural design, e.g. for aeronautics or automotive industries. The Center for X-ray Analytics at Empa was created to combine all major analytical X-ray technologies in one common platform and to facilitate the development of new instruments and methods exploiting numerous physical interaction mechanisms to address current and future challenges. At the center, not only absorption CT from the nano- to the meter-scale, but also phase-contrast CT, dark-field X-ray imaging, small- and wide-angle scattering and high-resolution X-ray diffraction is offered. This expertise of wide-ranging contrast-mechanisms is combined with developments in data-processing and image analysis as well as instrument improvements through the application of novel detector and source concepts, image reconstruction and artefact correction algorithms.
机译:复合材料如复合材料或聚集体通常含有弱吸收成分,并且必须以完全理解的不同长度尺度分析。这使得它们具有挑战古典X射线断层扫描的对象。实例包括多孔介质,例如木材,混凝土或泡沫,医疗植入物的涂层或纤维增强聚合物。,后者正在成为轻型结构设计的主要材料,例如,对于航空或汽车工业。 EMPA的X射线分析中心是创建的,以将所有主要分析X射线技术相结合,并促进开发新仪器和方法利用众多物理互动机制来解决当前和未来的挑战。在中心,不仅提供了从纳米到仪表级的CT,而且还提供了相位对比度CT,暗场X射线成像,小型和广角散射和高分辨率X射线衍射。 。这种广泛的对比机制的这种专业知识与数据处理和图像分析的发展以及通过应用新的检测器和源概念,图像重建和伪影校正算法以及仪器改进。

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