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Measuring the Quality of Shifting and Scaling Patterns in Biclusters

机译:测量平板中移位和缩放模式的质量

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The most widespread biclustering algorithms use the Mean Squared Residue (MSR) as measure for assessing the quality of biclusters. MSR can identify correctly shifting patterns, but fails at discovering biclusters presenting scaling patterns. Virtual Error (VE) is a measure which improves the performance of MSR in this sense, since it is effective at recognizing biclusters containing shifting patters or scaling patterns as quality biclusters. However, VE presents some drawbacks when the biclusters present both kind of patterns simultaneously. In this paper, we propose a improvement of VE that can be integrated in any heuristic to discover biclusters with shifting and scaling patterns simultaneously.
机译:最广泛的Biclustering算法使用平均平方残差(MSR)作为评估双板质量的措施。 MSR可以识别正确的变速模式,但在发现展示缩放模式的Biclusters时失败。虚拟错误(VE)是一种提高MSR的性能的措施,因为它有效地识别包含换档图案或缩放图案作为质量双板的平板。然而,当双板同时呈现两种模式时,ve呈现了一些缺点。在本文中,我们提出了改善,可以在任何启发式中融入任何启发式,以便同时使用换档和缩放模式。

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