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Three-Dimensional Structure of Helical and Zigzagged Nanowires Using Electron Tomography

机译:使用电子断层扫描的螺旋和锯齿状纳米线的三维结构

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Electron tomography and high-resolution transmission electron microscopy were used to characterize the unique three-dimensional structures of helical or zigzagged GaN, ZnGa_2O_4 and Zn_2SnO_4 nanowires. The helical GaN nanowires adopt a helical structure that consists of six equivalent <0-111> growth directions with the axial [0001] direction. The ZnGa_2O_4 nanosprings have four equivalent <011> growth directions with the [001] axial direction. The zigzagged Zn_2SnO_4 nanowires consisted of linked rhombohedrons structure having the side edges matched to the <011> direction, and the [111] axial direction.
机译:电子断层扫描和高分辨率透射电子显微镜用于表征螺旋或曲线GaN,Znga_2O_4和Zn_2SnO_4纳米线的独特三维结构。螺旋GaN纳米线采用螺旋结构,该螺旋结构包括六当量<0-111>的生长方向,轴向轴向[0001]方向。 Znga_2O_4纳米腔具有四等效的<011>生长方向,其轴向是轴向。 Z字形的Zn_2SNO_4纳米线由连接的菱形结构组成,其具有与<011>方向匹配的侧边缘,以及[111]轴向。

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