Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device

摘要

Spectrum analysis technique is introduced to measure the time delay of the silicon-on-insulator (SOI) micro-ring slow light device. The interference spectra of the TE and the TM polarization are obtained based on dual-quadrature spectral interferometry technique. By analyzing the observed spectral interference, the phase and time delay of the output optical pulse of SOI micro-ring is estimated. This method has a very high accuracy of time measurement because it avoids the impact of response speed of optoelectronic device, and moreover, it provides a complete measurement of the complex electric field as a continuous function of frequency.