ONE PHOTOGRAM RASTER-PHOTOGRAMMETRY FOR INDUSTRIAL PURPOSES. DEVELOPMENT OF A COMPUTER METHOD.

摘要

One photogram raster-photogrammetry is highly suitable for industrial purposes. In the present paper the technology, an industrial application and the software developed are described. In this method a reticule is projected onto the object by a metric projector and a photogram is taken by a metric camera. The reticule acts as a second, photogram. The metric projector was developed by AGIP from the project by E. Baj. The projector is a high precision instrument and his interior orientation is known with the same accuracy as that of the metric camera. A computer program has been developed to correct the relative orientation of camera and projector and evaluate the point coordinates. The method is based on coplanar1ty equations and does not require control points. A 3 dimensional graphic interface based on the CAD CATIA (Dassault Systemes) has been developed. Th1S measurement technology has been applied to the dimensional control of prefabricated pieces. In particular results from a structural joint survey are described.