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Optima Design of Contact Opening for Relieving Current Crowding Effect in Flip-Chip Solder Joints

机译:用于缓解倒装芯片焊点的电流挤压效应的接触开口的Optima设计

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The simulation results show that larger contact opening may not benefit on relieving current crowding effect in the flip-chip solder joints. For the solder joints with a 10-μm thick Cu UBM, the diameter of the contact opening for the lowest current crowding effect is 60 μm. It means that using larger or smaller diameter will increase the current density in the solder bumps. In addition, the optima diameter of the contact opening with a thin-film UBM is larger than that with a thick UBM. In this letter, the optimal design rule of contact opening for relieving current crowding effect in solder joints will be provided.
机译:仿真结果表明,较大的接触开口可能不会有利于在倒装芯片焊点中释放电流挤压效果。对于具有10μm厚Cu UBM的焊点,接触开口的直径为最低电流挤出效果为60μm。这意味着使用较大或更小的直径将增加焊料凸块中的电流密度。另外,具有薄膜UBM的接触开口的Optima直径大于厚UBM的接触开口。在这封信中,将提供用于缓解焊点上的电流挤压效果的接触开口的最佳设计规则。

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