Performing the conventional, signal response analysis on the data from the UT phased array measurements of the thick canister parts resulted in high scatter in the a vs. a diagram. One reason for the high scatter is the influence of more parameters on the response amplitude than just that of the defect size (as assumed in the conventional analysis). From the list of influencing parameters, as a first step, influences of the size, depth and orientation are taken into account. These parameters are combined into the single parameter, named multi-parameter a. Additionally; the way to display the volumetric distribution of the POD in the inspected part is presented. Finally, the way to combine POD's of several UT configurations, when the same volume of material is inspected, is shown.
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