首页> 外文会议>International Conference on Tugsten, Refractory Hardmetals >The study of microstructural evolution of cemented tungsten carbide during sintering using electron backscattered diffraction (EBSD) technique
【24h】

The study of microstructural evolution of cemented tungsten carbide during sintering using electron backscattered diffraction (EBSD) technique

机译:电子背散射衍射(EBSD)技术在烧结过程中粘合碳化钨微观结构演化研究

获取原文

摘要

The properties of cemented tungsten carbides strongly depend upon microstructural parameters such as grain size. A considerable grain growth and densification occurs during the solid state part of sintering. In order to understand the mechanisms of grain growth and its correlation to sintering, this study is focused on comprehensive microstructural analysis using the electron backscatter diffraction (EBSD) technique. A high population of grain boundaries with 90 deg misorientation about [1 0-1 0] is observed. These boundaries are low energy boundaries due to high lattice coincidence; therefore they should play an important role in grain growth. The evolution of microstructure shows that the population of these boundaries decreases as sintering progresses. The origin of these boundaries and their role in grain growth during sintering is also discussed.
机译:碳水化合物碳化物的性质强烈取决于微观结构参数,例如晶粒尺寸。在烧结的固态部分期间发生相当大的谷物生长和致密化。为了了解谷物生长的机制及其与烧结的相关性,本研究专注于使用电子反向散射衍射(EBSD)技术的综合微观结构分析。观察到具有90℃的晶界的高群界限约为[110-10]。由于晶格巧合,这些界限是低能量边界;因此,他们应该在谷物生长中发挥重要作用。微观结构的演化表明,随着烧结进展的进展,这些边界的群体降低。还讨论了这些界限的起源及其在烧结期间谷物生长的作用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号