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Subsurface mapping of nanofiller dispersion in polymeric coatings by quantitative electric force microscopy

机译:用定量电力显微镜通过聚合物涂层中纳米填充分散体的剥离映射

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Good dispersion of nanofillers in the polymer matrix is essential to optimize the performance of nanocomposite coatings. However, non-destructive characterization of nanofiller dispersion in coatings is a great challenge for traditional techniques. In this respect, electric force microscopy (EFM) is a promising tool to non-invasively map nanofillers dispersed in the polymer coatings. The main issue is how to quantify the measured EFM signal as a function of nanofiller depth, as the complex geometry of a commercial EFM probe makes the modeling of EFM signals difficult. Here we use custom-made ultra high aspect ratio EFM probe to map dispersion of carbon nanotubes and ZnO nanoparticles in various nanocomposite coatings. A model relating the measured EFM signal with the depth of nanofillers is proposed utilizing the simplified geometry of a custom-made EFM probe. This work demonstrates for the first time that quantitative EFM can be a valuable tool for subsurface imaging of nanofillers in polymer coatings with nanoscale spatial resolution.
机译:纳米填料在聚合物基质中的良好分散是必要的,以优化纳米复合涂层的性能。然而,在涂层中的纳米填充分散体的非破坏性表征是传统技术的巨大挑战。在这方面,电力显微镜(EFM)是对分散在聚合物涂层中的非侵入性地图纳米填料的有希望的工具。主要问题是如何量化测量的EFM信号作为纳米填充深度的函数,因为商业EFM探针的复杂几何形状使得EFM信号的建模难以实现。在这里,我们使用定制的超高纵横比EFM探针在各种纳米复合涂层中映射碳纳米管和ZnO纳米颗粒的分散。利用定制的EFM探针的简化几何形状提出了一种与纳米填充物深度相关的测量EFM信号的模型。这项工作首次演示了定量EFM可以是具有纳米级空间分辨率的聚合物涂层中纳米填充物的地下成像的有价值的工具。

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