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Subsurface mapping of nanofiller dispersion in polymeric coatings by quantitative electric force microscopy

机译:用定量电力显微镜通过聚合物涂层中纳米填充分散体的剥离映射

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Good dispersion of nanofillers in the polymer matrix is essential to optimize the performance of nanocomposite coatings. However, non-destructive characterization of nanofiller dispersion in coatings is a great challenge for traditional techniques. In this respect, electric force microscopy (EFM) is a promising tool to non-invasively map nanofillers dispersed in the polymer coatings. The main issue is how to quantify the measured EFM signal as a function of nanofiller depth, as the complex geometry of a commercial EFM probe makes the modeling of EFM signals difficult. Here we use custom-made ultra high aspect ratio EFM probe to map dispersion of carbon nanotubes and ZnO nanoparticles in various nanocomposite coatings. A model relating the measured EFM signal with the depth of nanofillers is proposed utilizing the simplified geometry of a custom-made EFM probe. This work demonstrates for the first time that quantitative EFM can be a valuable tool for subsurface imaging of nanofillers in polymer coatings with nanoscale spatial resolution.
机译:在聚合物基质中的纳米填料的良好分散是必要的,以优化纳米复合材料涂料的性能。然而,在涂料纳米填料分散的非破坏性的特性对于传统技术的巨大挑战。在这方面,电力显微镜(EFM)是一种有前途的工具,以非侵入性地映射分散在聚合物涂层的纳米填料。主要的问题是如何量化测得的EFM信号作为纳米填料深度的函数,作为商业EFM探针的复杂几何形状使得EFM的信号建模困难。在这里,我们使用定做的超高纵横比EFM探针映射碳纳米管和ZnO纳米颗粒在各种纳米复合材料涂层的分散体。与纳米填料的深度与所测量的EFM信号的模型,提出了利用一个特制的EFM探针的简化几何形状。这项工作表明,第一次是定量EFM可以在纳米尺度空间分辨率聚合物涂层纳米填料的地下成像的宝贵工具。

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