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DESIGN OF MICROCONTROLLER BASED CONTROL SYSTEMFOR AUTOMATIC GRAIN INSPECTION

机译:基于微控制器的自动晶粒检查控制系统设计

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To get the highest quality grains, the machine which uses the most effective automatic grain inspection system is needed for industries. Control system is the main portion of the grain inspection system. There are two portions in the control system of the automatic grain inspection system; image sensing unit and control unit. This paper presents the design of microcontroller based control unit of the control system. The grain position image data are sent from PC to PIC microcontroller by using serial communication. In this paper, the control system and software design of control unit are described for nozzle operation to remove the defected grains. Two PIC 16F877 microcontrollers are used for 60 nozzles operation in the control circuit. The abstraction of this paper is to contribute and apply the advanced control technique for rice and other grains inspection.
机译:为了获得最高品质的谷物,工业需要使用最有效的自动谷物检测系统的机器。控制系统是晶粒检测系统的主要部分。自动晶粒检测系统的控制系统中有两种部分;图像传感单元和控制单元。本文介绍了控制系统的微控制器控制单元的设计。晶粒位置图像数据通过使用串行通信从PC发送到PIC微控制器。本文描述了控制单元的控制系统和软件设计用于喷嘴操作以去除缺陷的晶粒。两个PIC 16F877微控制器用于控制电路中的60个喷嘴操作。本文的抽象是为了贡献和应用水稻和其他谷物检查的先进控制技术。

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