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Study of Thermal-runaway tests on Insulators subjected to DC voltages

机译:对DC电压进行绝缘子的热失控测试

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The failure of insulators under DC voltages is due to various factors like thermal runaway, ion migration, anode growth, surface erosion, cement growth etc... However, the rate of failure is higher in polluted zones where surface erosion and puncturing of insulators due to ion migration can occur. Therefore, insulators have to be subjected to accelerated ageing tests to simulate ion migration and to check their capability to withstand the stresses. Thermal runaway is also an important test. By carrying out Thermal runaway test at higher temperature, it may be possible to identify the good insulators. This paper presents the work carried out in order to find the quality of DC insulators by Thermal runaway tests and the measurement of the body resistance of the insulators. The voltage and temperature were varied during these tests in order to clearly differentiate the quality of insulators. The result will be useful for the design of insulators for the HVDC transmission system.
机译:DC电压下的绝缘体失败是由于热失控,离子迁移,阳极生长,表面侵蚀,水泥生长等的各种因素,但是,污染区域的失效率更高,其中表面侵蚀和绝缘体的穿刺到期可能发生离子迁移。因此,必须对绝缘体进行加速老化试验以模拟离子迁移,并检查其能力以承受应力。热失控也是一个重要的测试。通过在较高温度下进行热失控测试,可以识别良好的绝缘体。本文提出了通过热失控测试找到直流绝缘体的质量的工作,并测量绝缘体的车身阻力。在这些测试期间,电压和温度变化,以便清楚地区分绝缘体的质量。结果对于HVDC传输系统的绝缘体设计是有用的。

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