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Estimating the Reliability of Electronic Parts in High Radiation Fields

机译:估计高辐射场电子零件的可靠性

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Radiation effects on materials and electronic parts constrain the lifetime of flight systems visiting Europa. Understanding mission lifetime limits is critical to the design and planning of such a mission. Therefore, the operational aspects of radiation dose are a mission success issue. To predict and manage mission lifetime in a high radiation environment, system engineers need capable tools to trade radiation design choices against system design and reliability, and science achievements. Conventional tools and approaches provided past missions with conservative designs without the ability to predict their lifetime beyond the baseline mission. This paper describes a more systematic approach to understanding spacecraft design margin, allowing better prediction of spacecraft lifetime. This is possible because of newly available electronic parts radiation effects statistics and an enhanced spacecraft system reliability methodology. This new approach can be used in conjunction with traditional approaches for mission design. This paper describes the fundamentals of the new methodology.
机译:对材料和电子部件的辐射效应约束了飞行系统的寿命。了解任务终身限制对这种使命的设计和规划至关重要。因此,辐射剂量的操作方面是一个使命的成功问题。为了预测和管理在高辐射环境中的任务寿命,系统工程师需要能够进行贸易辐射设计选择的工具,防止系统设计和可靠性和科学成就。传统的工具和方法提供过去的任务,具有保守的设计,没有能够预测其超出基线任务的终身。本文介绍了了解航天器设计边缘的更系统的方法,从而更好地预测航天器寿命。这是可能的,因为新可用的电子零件辐射效应统计和增强的航天器系统可靠性方法。这种新方法可以与传统的任务设计方法一起使用。本文介绍了新方法的基础。

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