Improving Diagnosis Resolution without Physical Information

摘要

This paper presents an extended version of a diagnosis method proposed so far, that considers only the logic information provided by the tester to achieve diagnosis results. The main advantage of the proposed method is its capability to handle several fault models at the same time, e.g., static, dynamic, at transistor level, thus setting up a unified framework for logic diagnosis. Experiments on ITC'99 benchmark circuits show the efficiency of the proposed method both in terms of diagnosis resolution and required CPU time.