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Investigation on the Correction algorithm of lamina Based on Bilinear mapping

机译:基于双线性映射的薄层校正算法研究

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This paper proposes the correction algorithm of lamina based on bilinear mapping aimed at the problems of image incline and geometric distortion when collecting field lamina images using digital camera. The validity of measurement has not been influenced by size, figure differentia and white background of laminae. The experiment shows that the accuracy can reach to 99% when using this method to correct the lamina image, which is the basement of extracting the lamina features. (Abstract)
机译:本文提出了基于双线性映射的晶片校正算法旨在使用数码相机收集现场椎板图像的图像倾斜和几何失真问题。测量的有效性尚未受到Labinae的尺寸,图形不同的影响和白色背景。实验表明,使用该方法纠正薄层图像时,精度可以达到99%,这是提取薄层特征的基础。 (抽象的)

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