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Nonferroelectric Lead-Free Ceramics and Thick Films with High Dielectric Permittivity - Synthesis, Sintering and Properties

机译:具有高介电常介电常数 - 合成,烧结和性能的非传热无铅陶瓷和厚膜

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This work was focused on preparation and comparison of properties of the developed nonferroelectric lead-free high permittivity materials. Eight compounds of perovskite structure with compositions: Bi_(1/2)Cu_(1/2)(Fe_(2/3)W_(1/3))O_3, Ca(Fe_(2/3)W_(1/3))O_3, Bi_(1/2)Cu_(1/2)(Fe_(1/2)Nb_(1/2))O_3, Ca(Fe_(1/2)Nb_(1/2))O_3, Bi_(1/2)Cu_(1/2)(Fe_(1/2)Ta_(1/2))O_3, Ca(Fe_(1/2)Ta_(1/2))O_3, Bi_(2/3)Cu_3Ti_4O_(12) and Cu_2Ta_4O_(12) were synthesized. The obtained powders were used for fabrication of ceramic samples and pastes destined for dielectrics of plate and thick film capacitors. Capacitance and dissipation factor were measured at frequencies 10 Hz- 1 MHz in the temperature range from -55 to 700 °C and -55° to 400 °C for plate and thick film capacitors, respectively. Dc resistivity of the samples was investigated as a function of temperature in the range 20 – 500 °C. Microstructure and chemical homogeneity of the ceramics and layers were studied using scanning electron microscopy and X-ray microanalysis. High permittivity values exceeding 10000, observed especially at low frequencies for all the developed ceramic samples and some of the thick films, are supposed to originate from the formation of internal barrier layer capacitors. Broad maxima of dielectric permittivity and dissipation factor versus temperature plots, shifting towards higher temperatures with increasing frequency, as well as a distinct dependence of dielectric properties on frequency were characteristic of the investigated materials. In view of their lead-free composition and relatively simple preparation procedure, yielding high capacitance and miniaturization, the developed ceramics seem to be promising dielectric materials for capacitive elements.
机译:这项工作侧重于制备和比较开发的非传递无铅高介电常数材料的性能。八种钙钛矿化合物的组合物:Bi_(1/2)Cu_(1/2)(Fe_(2/3)W_(1/3))O_3,CA(FE_(2/3)W_(1/3) )O_3,Bi_(1/2)CU_(1/2)(FE_(1/2)NB_(1/2))O_3,CA(FE_(1/2)NB_(1/2))O_3,BI_( 1/2)CU_(1/2)(FE_(1/2)TA_(1/2))O_3,CA(FE_(1/2)TA_(1/2))O_3,BI_(2/3)CU_3TI_4O_ (12)合成CU_2TA_4O_(12)。所得粉末用于制造陶瓷样品和浆料,该陶瓷样品和浆料用于板材和厚膜电容器的电介质。在-55至700°C和-55°C和-55°C的温度范围内,在-55至700°C和-55°C至400°C的温度范围内测量电容和耗散因子。将样品的直流电阻率作为20-500℃的温度的函数进行研究。使用扫描电子显微镜和X射线微基分析研究了陶瓷和层的微观结构和化学均匀性。应该在所有开发的陶瓷样品和一些厚膜下观察到超过10000的高介电常数值,应该是源自内部阻挡层电容器的形成。介电介电常数和耗散因子与温度图的宽最大值,频率越来越高的温度,以及介电性质对频率的明显依赖性是所研究的材料的特征。鉴于其无铅组成和相对简单的制备程序,产生高电容和小型化,开发的陶瓷似乎是用于电容元件的有前途的介电材料。

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