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Tungsten Based Contact Materials for Low Voltage Vacuum Contactors

机译:基于钨的低压真空接触器的接触材料

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A comparative study has been made for tungsten and tungsten carbide based contact materials for low voltage contactors. The materials investigated include WAg, WCAg and WCCu. Tests include lifetime measurements under AC4 conditions at 400 A, as well as determination of the chopping current. The results are compared to those of a standard CuCr40 material. The WCAg materials are preferred to the other tested contact materials in terms of chopping current; in addition, the contact erosion rate is considerably lower than that of CuCr and WAg. The WCCu materials, on the other hand, show a tendency towards an even lower erosion rate, although the chopping current is higher than that of WCAg materials, but still considerably less than those of WAg and CuCr. WC-based contact materials promise to extend the range of applications of low voltage contactors, in particular in terms of lifetime and low surge requirements.
机译:对低压接触器的钨和碳化钨的接触材料进行了比较研究。调查的材料包括摇摆,WCAG和WCCU。测试包括在400A的AC4条件下的寿命测量,以及斩波电流的测定。将结果与标准CUCR40材料的结果进行比较。在斩波电流方面,WCAG材料是其他测试的接触材料;此外,接触腐蚀速率远低于CUCR和摇头的损耗。另一方面,WCCU材料显示出甚至较低的侵蚀速率的趋势,尽管斩波电流高于WCAG材料的倾斜,但仍然远低于摇摆和CUCR的趋势。基于WC的接触材料承诺扩展低压接触器的应用范围,特别是在寿命和较低的浪涌要求方面。

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