Additive Manufacturing capabilities are reaching the point where it is possible to fabricate single objects with part dimensions ranging from micrometers to meters out of multiple materials. Characterizing the object structure over these length scales increasingly relies on x-ray computed tomography (CT). However, as the material and size ranges continue to increase, the requirements often exceed the capabilities of a single measurement instrument and require the fusion of multi-length-scale and multimodality data. We have developed a range of X-ray CT capability to meet such needs. [1] We describe new X-ray CT capabilities at LLNL to characterize small (micrometer to millimeter) objects with 50 nm to several μm spatial resolution. This work describes the fusion of absorption and phase-contrast NanoCT to characterize the 3D submicron deposition of boron on a silicon pillar array.
展开▼
