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Low voltage lithographic fuses: Preliminary results of breaking capacity and cyclic load tests

机译:低压光刻保险丝:断裂能力和循环负载测试的初步结果

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High breaking capacity fuse of low rated current is one of the most difficult fuses to design and build. The fuse element is of such small dimensions that its mechanical fragility is too high. Besides the fuse filler, usually quartz sand could deteriorate the element after the assembling, mainly during the filling process. In order to solve this difficulty the fuse-on-substrate technique has been in use from the 1980 decade. Initially rigid substrate materials were used, such as alumina, silica, glass-polytetrafluoroethylene (PTFE), solidified quartz sand, etc. Also extra cooling was provided through a metallic plate applied to the other substrate face. Lately, lithographic techniques in use for printed circuit construction were extended for fuse manufacturing on flexible substrates. The offset printing technique on flexible substrate added to the use of new conductive inks, allows the manufacturing of good accuracy dimension fuses. The lithographic fuses could find an excellent application field on the protection of small size semiconductors. Several fuse samples on three dissimilar flexible substrate materials were manufactured, having rated current from 0.1 to 1 A. Rated current and temperature rise tests do not represent a problem due to the low current values. However the main manufacturers’ concerns are related with cyclic long duration overload behavior and high current breaking performance. The paper presents the results of a limited number of cyclic loading, and high current breaking tests. The high current tests correspond to duties I1 and I2 specified by IEC 60127, carried out in a circuit with 230 V ac and currents of about 1,500 A. It is preliminarily concluded that fuses using one of the tested substrates present a reasonably good performance, no far away from the conventional HBC fuse. Further research is necessary especially on the fuse material dimensions accuracy and on substrate material behavior under arcing conditio-ns.
机译:低额定电流的高断裂容量保险丝是设计和构建最困难的保险丝之一。保险丝元件是其机械脆性太高的小尺寸。除了保险丝填充物之外,通常石英砂可能会在组装后劣化,主要是在灌装过程中。为了解决这种困难,熔丝衬底技术已经在1980年代中使用。使用初始刚性基底材料,例如氧化铝,二氧化硅,玻璃 - 聚四氟乙烯(PTFE),凝固的石英砂等。通过施加到另一个基板面的金属板提供额外的冷却。最近,用于印刷电路结构的光刻技术在柔性基板上为保险丝制造延伸。柔性基板上的胶版印刷技术添加到使用新导电油墨中,允许制造良好的精度尺寸熔断器。光刻保险丝可以在保护小型半导体上找到一个很好的应用领域。制造了三种不同柔性基板材料上的几个熔断器样品,具有0.1至1A的额定电流。额定电流和温度上升试验不代表由于低电流值而表示问题。然而,主要制造商的担忧与循环长度持续时间过载行为和高电流断开性能有关。本文呈现了有限数量的循环载荷和高电流破碎试验的结果。高电流测试对应于职责我 1 和余 2 由IEC 60127规定的,在具有230伏交流和大约1500 A的电流的电路进行,是预先得出结论,使用其中一个测试基材的熔断器具有相当良好的性能,远离传统的HBC保险丝。进一步的研究特别是在熔丝材料尺寸精度和电弧条件下的熔丝材料尺寸准确度和基板材料行为上。

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