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MICROWAVE CIRCUITS TECHNIQUE FOR MEASURING OPEN RESONATOR PARAMETERS UNDER CONDITIONS OF HYBRID MODE EXCITATION

机译:微波电路技术在混合模式激励条件下测量开放谐振器参数

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The resonance frequency and unloaded quality-factor of a microwave resonator with one coupling element can be measured by the method of total impedance [1]. The methods of determination of losses in the coupling devices are developed [1,2], in particular, the determination of radiating losses in the coupling elements of open resonators (OR) [3,4], neglection of which results in regular errors. The method of total impedance, in its classical form, assumes the excitation of single modes in the resonator. The eigen frequencies of these modes are separated by the values exceeding several half-widths of the resonance curves. However, in the measurements of dielectric or magnetic properties of materials the "splitting" a resonant curve is observed [5] (removal of mode degeneration). Besides, in the range of a single mode resonance curve, widened owing to interaction of the resonator mode with analyzed sample, other modes can be observed [6]. Therefore, development of methods able to measure insertion losses and shift of resonant frequency of the working mode in the presence of the other closely located modes, is of significant interest. In [5], a resonator method of surface impedance measurement for "on pass" regime in the presence of the mode splitting has been offered. However, here it is required, that the quality-factors and the normalized frequencies for two components of a complex mode should be identical. We present here a method of measurement of the partial characteristics of two modes making a hybrid oscillation in the resonator with arbitrary Q-factors and coupling coefficients. The difference of modal eigen-frequencies and the coupling factor are calculated simultaneously.
机译:具有一个耦合元件的微波谐振器的共振频率和卸载质量系数可以通过总阻抗的方法进行测量[1]。特别地,特别地,确定了耦合器件中损耗的方法[1,2],特别是确定开放谐振器(或)[3,4]的耦合元件中的辐射损耗,忽略它导致规则误差。以其经典形式的总阻抗的方法假设谐振器中的单个模式的激发。这些模式的特征频率由超过谐振曲线的几半宽度的值分开。然而,在材料的测量中,观察到“分裂”谐振曲线[5](去除模式退化)。此外,在单模谐振曲线的范围内,由于谐振器模式与分析样品的相互作用而加宽,可以观察到其他模式[6]。因此,在其他紧密定位的模式存在下,能够测量工作模式的插入损耗和谐振频率的谐振频率的偏移的发展是重大兴趣。在[5]中,已经提供了在模式分裂的存在下“在通过”状态下的表面阻抗测量的谐振器方法。然而,在这里需要,复杂模式的两个组件的质量因子和归一化频率应该是相同的。我们在这里存在一种测量两种模式的局部特征的方法,使具有任意Q因子和耦合系数的谐振器中的混合振荡。同时计算模态特征频率和耦合因子的差异。

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