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Research on Measuring Surface Roughness by Light Scattering Method

机译:光散射法测量表面粗糙度的研究

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In this paper, the relation equation between the scattering light and the rough surface is deduced from the established simplified model. Based on the research on the scattering spectrum, some functions or parameters, which are in one-to-one correspondence with the magnitude of the surface roughness, are found out to represent the surface roughness. And these functions or the parameters are used in the mathematical model, which represents the relationship between the surface roughness and the light scattering spectrum. On the basis of the theoretical research, a measurement system of the surface roughness is composed of the semiconductor laser and the cygnal single chip microcomputer, and some experiments are carried out.
机译:在本文中,从已建立的简化模型推导出散射光和粗糙表面之间的关系方程。基于对散射光谱的研究,发现一些功能或参数,其与表面粗糙度的大小一对一的对应关系,以表示表面粗糙度。这些功能或参数用于数学模型,这代表了表面粗糙度和光散射谱之间的关系。在理论研究的基础上,表面粗糙度的测量系统由半导体激光器和Cygnal单片机组成,并进行一些实验。

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