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Aging-induced Recombination Zone Shift in Mixed-Host Organic Light-emitting Devices

机译:混合宿主有机发光器件中的衰老诱导的重组区换档

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In this paper, we have demonstrated the time-dependent distribution of recombination-rate of a mixed-host (MH) organic light-emitting devices (OLEDs) by co-evaporating an ultra thin red-emitting doped layer (probe). With various probe position, the intensity ratio of red to green directly indicates the exciton distribution in MH layer. If the position of probe insertion is that of maximum recombination-rate, the driving voltage is also reduced which can be explained by the increase of the recombination current. From spectral and J-V analyses, the maximum recombination-rate position is 10 nm to the hole transporting layer when MH-OLED is not aged. After 48 hours of the DC aging test, the changes in the red to green intensity ratio of different devices are different. After 96 hours aging, this ratio does not change further among all devices, indicative of the achievement of steady state of recombination-rate distribution. The organic materials degrade more when it locates near the maximum of the recombination-rate.
机译:在本文中,我们通过共蒸发超薄红发掺杂层(探针)来证明了混合宿主(MH)有机发光器件(OLED)的重组率的时间依赖性分布。通过各种探针位置,红色至绿色的强度比直接表示MH层中的激子分布。如果探针插入的位置是最大重组速率的位置,则还减少了驱动电压,这可以通过增加重组电流的增加来解释。从光谱和J-V分析,当MH-OLED未老化时,最大重组率位置是空穴传输层10nm。在DC老化测试48小时后,红色与不同器件的绿色强度比的变化不同。老化96小时后,该比例在所有器件中不会进一步变化,指示重组率分布的稳定状态。当定位在重组速率的最大值附近时,有机材料更加劣化。

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