Micromagnetic modeling based on LLG formalism was used to study the magnetization reversal processes in patterned recording layer. The write fields generated by an idealized single pole write head with a uniformly magnetized air-bearing surface (ABS) were used. This approximation allows consistent addressing of the fundamental recording physics issues while avoiding the artifacts of finite element modeling, which are strong functions of the head geometry, choice of saturation curve, and the type of solver used (e.g. boundary element vs. finite element models). The minimum value of 4πM{sub}S of the write pole sufficient to cause a reliable bit reversal was chosen as a figure of merit for the analysis of different recording configurations. The applied write field is highly non-uniform within a bit, making consistent comparison based on its values difficult. The effects of the bit geometry, medium thickness, head/medium magnetic spacing (flying height), ABS geometry, the effects of neighboring bits on magnetization reversal, and the sensitivity of the write process to non-zero write misregistration (WMR) were investigated. WMR is defined as the mutual shift of the head and the bit in the direction along the track with respect to their vertical symmetry axes.
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