Conductive Microbead Array Detection Based on Eddy-Current Testing Using SV-GMR Sensor and Helmhlotz Coil Exciter

摘要

Eddy-current testing (ECT) using a spin-valve giant magnetoresistance (SV-GMR) sensor has been applied to detecting conductive micro-beads and also flaws on a printed circuit board [1]. This paper presents the detection of conductive micro-bead arrays with the gap between SV-GMR sensor and bead for scanning probe. The experimental results can confirm the proposed probe ability for detection of conductive micro-bead array.