Soft x-ray laser interferometry unveils plasmas with index of refraction greater than one

摘要

We report clear evidence of the existence of multiply ionized plasmas with index of refraction greater than one at soft x-ray wavelengths. Moreover, it is shown to be a general phenomenon affecting broad spectral regions in numerous highly ionized plasmas. The experimental evidence consists of the observation of anomalous fringe shifts in soft x-ray laser interferograms of laser-created Al plasmas probed at 14.7 nm and of Ag and Sn laser-created plasmas probed at 46.9 nm. The comparison of measured and simulated interferograms shows that these anomalous fringe shifts result from the dominant contribution of low charge ions to the index of refraction. This usually neglected bound electron contribution can affect the propagation of soft x-ray radiation in plasmas and the interferometric diagnostics of plasmas for many elements and at different wavelengths.