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A NIST Traceable PCB Kit for Evaluating the Accuracy of De-Embedding Algorithms and Corresponding Metrics

机译:用于评估去嵌入算法和相应度量的准确性的NIST可追踪的PCB套件

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The constant increase in high speed digital data rates creates a corresponding decrease in design margins and the need for engineering innovations. Specifically, exploring design trade-offs to achieve reduced design margins requires accurate electrical measurements of the physical layer components that make the end-to-end digital link. The measurement accuracy provided by traditional coaxial connectors is non-existent in modern day high-density PCB interconnect designs. This has created the opportunity for innovations in measurement technology to remove custom fixturing with calibration, and the need for validation and comparison to ensure measurement accuracy. The challenge is that there is no one solution for fixture removal, and fixture removal often requires significant engineering experience to understand the trade-offs of accuracy and calibration standard choice. In addition, most test engineers are faced with using commercial software tools that de-embed the test fixture using unknown proprietary algorithms based on a 2x-thru or 1x-reflect methodology, and traditional calibration verification standards are not readily available for these custom fixture removal techniques. Since the de-embedded measurements cannot be validated, engineers are concerned about the accuracy of the measurement of a device under test (DUT) after fixture removal. This concern is exacerbated when the DUT measurement plays a major role to determine the system margin of multi-gigabit serial link systems. The IEEE P370 standard is being developed to address these concerns and this paper focuses on the working area defining methodologies to evaluate the accuracy of a de-embedding algorithm. The IEEE P370 standard uses both simulated and measurement data. A simulation library contains modeled fixtures, DUTs, and verification standards. Thus, the DUT after removal can be compared directly to its modeled counterpart. Conversely, a plug-and-play PCB kit connects fixtures and DUTs together using NIST traceable connections. The result is a DUT that is accessible both directly with coaxial connection and indirectly with de-embedding algorithms. In this paper, we will present the plug and play kit for single-ended and coupled differential applications and show how it can be used to verify de-embedding algorithms with open-source 2x-thru and 1x-reflect de-embedding methodologies. Because the kit is composed of real PCB test structures, it contains all the problems associated with real PCBs, and its design is such that it allows the results of a deembedding algorithm to be compared with the real DUT results in a NIST traceable measurement setup.
机译:高速数字数据速率的恒定增加会产生相应的设计边距和工程创新的需求。具体而言,探索设计权衡以实现减少的设计边距,需要精确的电气测量来实现端到端数字链路的物理层组件。传统同轴连接器提供的测量精度在现代高密度PCB互连设计中是不存在的。这为测量技术中的创新创造了机会,以便用校准去除自定义固定性,以及需要验证和比较,以确保测量精度。挑战是夹具拆除没有一种解决方案,夹具去除通常需要重大的工程经验来了解准确性和校准标准选择的权衡。此外,大多数测试工程师都面临使用使用基于2x-thru或1x-反射方法的未知专有算法将测试夹具除外的商业软件工具,而传统的校准验证标准不容易获得这些自定义夹具删除技巧。由于无法验证未嵌入的测量,因此工程师涉及在夹具移除后进行测试(DUT)的测量的准确性。当DUT测量发挥重要作用以确定多千兆串行链路系统的系统裕度时,这种担忧会加剧。正在开发IEEE P370标准以解决这些问题,本文侧重于定义方法,以评估解除嵌入算法的准确性。 IEEE P370标准使用模拟和测量数据。仿真库包含建模夹具,DUT和验证标准。因此,去除后的DUT可以直接比较其建模的对应物。相反,使用NIST可追溯连接将固定装置和DUT连接在一起的即插即用PCB套件。结果是一种DUT,可直接使用同轴连接,间接地与去嵌入算法间接提供。在本文中,我们将介绍单端和耦合差分应用的插头和播放套件,并展示如何使用它来验证具有开源2x-Thru和1x-Exclex的解除嵌入方法的去嵌入算法。由于套件由真正的PCB测试结构组成,因此它包含与真实PCB相关的所有问题,并且其设计使得它允许与NIST可追踪测量设置中的实际DUT进行比较算法的结果。

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