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Mid Infrared InP-based Photodiodes operating at/near Room temperature

机译:基于红外线的基于INP的光电二极管,在室温下工作

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Photon detectors operating in the MWTR. (2 to 5 μm) are important in applications such as pollution detection, industrial process monitoring, chemical forensics, chemical and biological warfare, and non-invasive medical diagnostics. Current photon detectors in the MWIR use two different types of optical transitions: inter-subband and band-to-band. For inter-subband photodetectors, QWIPs are the mainstay technology. To get reasonable detectivities, these devices must be operated at cryogenic temperatures, which significantly increase system costs. For detectors using band-to-band transitions, HgCdTe is the predominant material system used in devices today. HgCdTe focal plane arrays used for imaging applications often suffer from material non-uniformity and low yield. Our research goal is to develop InP-based devices as an alternative for MWIR detection. The approach we have pursued for longer wavelength detection on InP is a type-II superlattice consisting of Ga{sub}xIn{sub}(1-x)As and GaAs{sub}ySb{sub}(1-y) alloys. These structures provide two advantages for MWIR detection: large (greater than 700 meV) direct band-gaps, which should lead to a lower thermal carrier generation rate and the ability to adjust the detection wavelength by changing the compositions of GaInAs and GaAsSb and their thickness, in the superlattice
机译:光子检测器在操作MWTR。 (2至5μm)中的应用,如污染检测,工业过程监测,化学法医学,化学和生物战,和非侵入性的医疗诊断的重要。当前光子检测器在MWIR使用两种不同类型的光学跃迁的: - 子带间和带 - 能带。对于子带间的光电探测器,量子阱红外探测器的主体技术。为了得到合理的探测率,这些设备必须在低温下,这显著增加系统成本操作。对于使用带 - 能带跃迁检测器,碲镉汞是当今设备中使用的主要材料系统。用于成像应用的HgCdTe焦平面阵列通常由材料的非均匀性和低屈服患。我们的研究目标是开发基于InP的器件为中波红外检测的替代品。我们所追求较长波长检测在InP上的方法是一种II型超晶格自由Ga {子}辛{子}(1-X)As和砷化镓{子} {YSB子}(1-Y)合金。这些结构提供了MWIR检测两个优点:大(大于700兆电子伏)直接带隙,这应该导致更低的热载流子产生速率和通过改变的GaInAs和GaAsSb的和它们的厚度的组合物中以调整检测波长的能力在超晶格

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